Band Edge Thermometry System
- Uses TE cooled InGaAs diode array spectrometer for reliable 24×7 operation
- Temperature measurements possible on InP, GaAs, Si wafers with up to ±0.1°C precision
- Works with light from the heater filament or transmission through a quartz rod
- In reflectance mode can be used to measure and control DBR growth for VCSELs
- Competetively priced
